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Douglas G. Frank, Ph.D.
Doug@ToolsForAnalysis.com

Education
  Dr. Frank received a B.A. in Chemistry from Westmont College in Santa Barbara, California. He qualified for his doctorate at the University of California, Santa Barbara before transferring to the University of Cincinnati in 1986 as part of the Ohio Eminent Scholar program. In 1990, he received a Ph.D. in Surface Analytical Chemistry. After graduating, he formed "ADAM Instrument Company, Inc.," named for the new surface analysis technique he discovered during his graduate studies. The "ADAM" technique brought him international acclaim, and his work was featured in several scientific books and international journals, including cover articles in Science and Naturwissenschaften. He has over 50 scientific publications, and is internationally regarded as an expert in Auger spectroscopy.

  Corporate Consulting - Research & Development
  Dr. Frank's scientific reputation gained him introductions to several U.S. companies, where he learned to apply his scientific and computer expertise to real-life research and development challenges. He specializes in the development of custom control and analytical solutions, and has invented several instruments for surface optical characterization, precision force application, and soil analysis by means of portable electron microscopy and spectroscopy.
Corporate Consulting - Systems Integration and Automation
  Dr. Frank's scientific, electronic, instrumental, and software expertise make him an asset in situations requiring systems integration. His combination of skills makes him especially suited for the preparation and development of 'intelligent' user-friendly software that allows straightforward operation and control in complicated manufacturing and analytical environments. Sometimes, he is retained to provide only the intelligent software 'glue' that holds an integrated system together. Other times, the broader resources of PAI are brought to bear, allowing a prototype design and development solution to be expedited.
 
      Some recent consulting projects include:
  • Precision motion control and integration of multi-axis industrial manufacturing devices;
  • Design, manufacture, and construction of industrial research instruments;
  • Design, manufacture, and integration of industrial quality control instrumentation;
  • Software integration of multiple devices for new analytical instrumentation;
  • System design and software development for remote access to precision motion control;
  • Development and manufacturing of precision measurement devices and layout tools for the bowling industry.
             

SELECTED BIBLIOGRAPHY
1. pH and Potential Dependence of the Electrical Double Layer at Well-Defined Electrode Surfaces: Cs+ and Ca2+ at Pt(111)(2?3x2?3)R30°-CN-, Pt(111)(?13x?13)R14°-CN- and Pt(111)(2x2)-SCN-. Douglas G. Frank, James Y. Katekaru, Stephen D. Rosasco, Ghaleb N. Salaita, Bruce C. Schardt, Manuel P. Soriaga, Donald A. Stern, John L. Stickney and Arthur T. Hubbard, Langmuir 1, 587 (1985).
2. Films Formed on Stainless Steel Single-Crystal Surfaces in Aqueous Solutions: Studies of the (100) Plane by LEED, Auger Spectroscopy and Electrochemistry. Douglas G. Frank, Victor K. F. Chia, Mark Schneider and Arthur T. Hubbard, Langmuir 3, 860 (1987).
3. Imaging Surface Atomic Structure by Means of Auger Electrons. Douglas G. Frank, Nikola Batina, Teresa Golden, Frank Lu, and Arthur T. Hubbard, Science 247, 182 (1990).
4. Direct Imaging of Surface Atomic Structure by Angular Distribution Auger Microscopy (ADAM): The Bare Pt(111) Surface. Douglas G. Frank, Nikola Batina, James W. McCargar and Arthur T. Hubbard, Langmuir 5, 1141 (1989).
5. Auger Emission Angular Distributions from a Silver Monolayer in the Presence and Absence of an Iodine Overlayer: Evidence for the Predominance of Inhomogeneous Inelastic Scattering of Auger Electrons by Atoms. Douglas G. Frank, Oliver M.R. Chyan, Teresa Golden and Arthur T. Hubbard, J. Phys. Chem. 98, 1895 (1994).
6. Direct Imaging of Epitaxial Layers by Angular Distribution Auger Microscopy. Douglas G. Frank, Frank Lu, Teresa Golden and Arthur T. Hubbard, Mater. Res. Soc. Bull. 15, 19 (1990).
7. Imaging Surface Atomic Layers by Means of Auger Electrons (cover article). Nikola Batina, Oliver M. R. Chyan, Douglas G. Frank, Teresa Golden and Arthur T. Hubbard, Naturwissenschaften 77, 557 (1990).
8. Direct Imaging of Thin Film Atomic Structure by Angular Distribution Auger Microscopy (ADAM). Douglas G. Frank, Teresa Golden, Oliver M.R. Chyan and Arthur T. Hubbard, Proceedings of the 5th International Conference on Solid Films and Surfaces, Applied Surface Science 48/49, 166 (1991).
9. Imaging Monolayer Structure by Means of Auger Electrons. Douglas G. Frank, Oliver M. R. Chyan, Teresa Golden and Arthur T. Hubbard, J. Vac. Sci. Technol. A10, 158 (1992).
10. Auger Electron Angular Distributions from Al(100): Resolution of an Apparent Contradiction. Oliver. M.R. Chyan, Douglas G. Frank, Charles A. Doyle and Arthur T. Hubbard, J. Vac. Sci. Technol. A11, 2659 (1993).
11. Angular Distribution Auger Microscopy. Douglas G. Frank and Arthur T. Hubbard, in the "Concise Encyclopedia of Materials Characterization", R.W. Cahn, Ed. (Pergamon Press, Oxford, 1993), p. 34.
12. Auger Electron Angular Distributions from Pt(111): The Effect of Adsorbed Iodine Monolayers. Charles A. Doyle, Oliver M. R. Chyan, Douglas G. Frank and Arthur T. Hubbard, Surf. Int. Anal. 21, 123 (1994).
13. Electrode Reactions of Well-Characterized Adsorbed Molecules. Curtis Shannon, Douglas G. Frank, and Arthur T. Hubbard, Ann. Revs. Phys. Chem. 42, 393 (1991).
14. Probing Three Distinct Iodine Monolayer Structures at Pt(111) by Means of Angular Distribution Auger Microscopy (ADAM): Results Agree with Scanning Tunneling Microscopy. Douglas G. Frank, Oliver M.R. Chyan, Teresa Golden and Arthur T. Hubbard, J. Phys. Chem. 97, 3829 (1993).
15. Angle-Resolved Auger Electron Spectroscopy. Douglas G. Frank in The Handbook of Surface Imaging and Visualization, A. T. Hubbard, Ed. (CRC Press, 1996).
16. LEED Pattern Directory. Douglas G. Frank in The Handbook of Surface Imaging and Visualization, A. T. Hubbard, Ed. (CRC Press, 1996).
17. Comparison of an Electron-Atom-Scattering Description with Gas-Phase Scattering Data for He, Ne, Ar, Kr, and Xe. Douglas G. Frank and Arthur T. Hubbard, J. Phys. Chem. A 101, 894 (1997).
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Revised 1/5/2009